Hitachi High Technologies America Launches Vortex®-ME7 Silicon Drift X-ray Detector

Nov 08, 2018

Vortex®-ME7 Silicon Drift X-ray Detector

 

Vortex®-ME7 Silicon Drift X-ray Detector

Specifications

General Description—ME7 Silicon Drift Detector (SDD)

Vortex®-ME7 is a seven-element silicon drift detector (SDD) X-ray detection system with a total active area of 210 mm2 – 350 mm2 design with a probe diameter of only 1.5″ (38.1 mm).

The Vortex®-ME7 offers superior energy resolution and high-throughput performance to enhance the total analytical performance of the X-ray spectrometry system.

Typical Applications

  • X-ray fluorescence (XRF) spectroscopy, both bulk- and micro-fluorescence
  • Synchrotron radiation applications
  • Process control
  • Fast X-ray mapping

The Vortex®-ME7 SDD is operated at near room temperature and cooled by a thermoelectric cooler (TEC), and can be cycled as frequently as needed without any degradation in detector performance. Cool-down times are typically less than 3 minutes.

The Vortex®-ME7 X-ray spectroscopy systems include a detector unit and control box which includes power supplies for the detector, TEC, and an optional digital pulse processor.

The complete detector also contains charge-sensitive preamplifiers and temperature-stabilization system, which eliminates concerns of varying ambient temperature.