January 15, 2020 Materials Analysis Product Launch

Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm

January 15, 2020 Hitachi High-Tech Science Corporation announced the release of the FT160 series of X-ray coating thickness gauges for measuring plating thickness and composition at micro spots of less than 100 micrometers in diameter. Advances in mobile electronic devices such as smartphone and tablet PCs, as well as in automotive electronic components have resulted... Read more

May 14, 2019 Molecular Spectroscopy Product Launch

Hitachi High Technologies America Launches AC Series Photoemission Yield Spectroscopy in the Air (PYSA)

May 14, 2019 AC Series has an open air system that can determine the Work Function (WF) and the Ionization Potential (IPs) for a variety of material types such as organic material, semiconductor, and metal. Material format can be from thin film to powders. Overview Specifications Allows Easy Measurement of the Work Function (WF) and... Read more

May 9, 2019 Materials Analysis Product Launch

Hitachi High-Tech Science Launches the “NEXTA STA Series” Thermal Analyzer

—World-class High-Sensitivity Measurements for Testing and Component Analysis of Minute Sample Quantities— Tokyo, Japan, May 9, 2019—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that its wholly owned subsidiary and analytical instrument manufacturer and marketer Hitachi High-Tech Science Corporation (HHT Science) has developed the new “NEXTA STA Series” of thermal analyzers. The NEXTA STA... Read more

January 16, 2019 M&A, Partnerships Microscopy

Hitachi High-Technologies Acquires All Shares of Applied Physics Technologies, Inc., a U.S. Manufacturer of Electron Sources

Tokyo, Japan, January 16, 2019 – Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that on January 15, 2019 Hitachi High-Tech acquired all issued shares of Applied Physics Technologies, Inc. (Head Office: Oregon, U.S.A.; Representative: William Mackie, APTech), which develops, manufactures and sells electron sources for use in electron microscopes and other instruments. Following the... Read more

November 8, 2018 Atomic Spectroscopy Product Launch

Hitachi High Technologies America Launches Vortex®-ME7 Silicon Drift X-ray Detector

Nov 08, 2018 Vortex®-ME7 Silicon Drift X-ray Detector   Specifications General Description—ME7 Silicon Drift Detector (SDD) Vortex®-ME7 is a seven-element silicon drift detector (SDD) X-ray detection system with a total active area of 210 mm2 – 350 mm2 design with a probe diameter of only 1.5″ (38.1 mm). The Vortex®-ME7 offers superior energy resolution and high-throughput performance... Read more

July 31, 2018 Microscopy Product Launch

Hitachi High-Technologies Launches the SU7000: A Transformative Schottky Field Emission Scanning Electron Microscope

(PDF format, 268kBytes) — High Throughput, Large Chamber, Enhanced Versatility — Tokyo, Japan, July 31, 2018—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with simultaneous acquisition as well as... Read more

March 20, 2018 Atomic Spectroscopy

“Hitachi High-Tech Science Park Shanghai Lab” to Open in Shanghai, China

— Establishing a global laboratory structure covering nine locations in five countries — Shanghai, China, March 20, 2018—Hitachi High-Technologies (Shanghai) Co., Ltd., a Chinese subsidiary of Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announces that it has opened “Hitachi High-Tech Science Park Shanghai Lab” (Shanghai Lab) in Shanghai, China on June 20, 2018 to promote... Read more