Hitachi High-Tech Announces Executive Responsibility Change
July 29, 2021 Read more
Tag: Hitachi High-Technologies
Launch of Fluorescent X-ray Coating Thickness Gauge FT160 series that enables measurement of micro-spot smaller than 100µm
January 15, 2020 Hitachi High-Tech Science Corporation announced the release of the FT160 series of X-ray coating thickness gauges for measuring plating thickness and composition at micro spots of less than 100 micrometers in diameter. Advances in mobile electronic devices such as smartphone and tablet PCs, as well as in automotive electronic components have resulted... Read more
Strengthening Our Portfolio of Transmission Electron Microscopes for the Pharmaceutical Industry Through Investment to Vironova AB
Hitachi High-Technologies Corporation (TSE:8036/Hitachi High-Tech) have undertaken a third-party allotment of shares (this capital alliance) with Vironova AB (Main office: Stockholm, Sweden /CEO: Mohammed Homman/Vironova), who develop and sell analysis software for transmission electron microscopes (TEM) along with carrying out contract analysis for pharmaceutical companies. Through this capital alliance, we aim to jointly develop TEM... Read more
Hitachi High-Technologies to Launch Advanced High Voltage CD-SEM “CV6300 Series”
—Deep holes and trench bottom measurements for 96 layers and beyond 3D-NAND flash memory manufacturing. Precise overlay measurements of device patterns.— Tokyo, Japan, July 2, 2019, Hitachi High-Technologies Corporation (TSE:8036, Hitachi High-Tech) announced today that it will launch sales for the Advanced High Voltage CD-SEM “CV6300 Series”. CV6300 is the successor of the CV5000 Series,... Read more
Hitachi High Technologies America Launches AC Series Photoemission Yield Spectroscopy in the Air (PYSA)
May 14, 2019 AC Series has an open air system that can determine the Work Function (WF) and the Ionization Potential (IPs) for a variety of material types such as organic material, semiconductor, and metal. Material format can be from thin film to powders. Overview Specifications Allows Easy Measurement of the Work Function (WF) and... Read more
Hitachi High-Tech Science Launches the “NEXTA STA Series” Thermal Analyzer
—World-class High-Sensitivity Measurements for Testing and Component Analysis of Minute Sample Quantities— Tokyo, Japan, May 9, 2019—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that its wholly owned subsidiary and analytical instrument manufacturer and marketer Hitachi High-Tech Science Corporation (HHT Science) has developed the new “NEXTA STA Series” of thermal analyzers. The NEXTA STA... Read more
Hitachi High-Technologies Launches the SU3800 and SU3900 Scanning Electron Microscopes
April 3, 2019 — Featuring a large specimen chamber and advanced functionalities — Tokyo, Japan, April 3, 2019—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will commence sales of the SU3800 and the oversized SU3900 scanning electron microscopes (SEMs) featuring the ability to accommodate large, heavy specimens, along with advanced functionalities for... Read more
Hitachi High Technologies America Launches Vortex®-ME7 Silicon Drift X-ray Detector
Nov 08, 2018 Vortex®-ME7 Silicon Drift X-ray Detector Specifications General Description—ME7 Silicon Drift Detector (SDD) Vortex®-ME7 is a seven-element silicon drift detector (SDD) X-ray detection system with a total active area of 210 mm2 – 350 mm2 design with a probe diameter of only 1.5″ (38.1 mm). The Vortex®-ME7 offers superior energy resolution and high-throughput performance... Read more
Announcing Transfer of EMAX Series Sales and Maintenance Service Operations
August 1, 2018 July 31, 2018 To Our Valued Customers HORIBA, Ltd. Oxford Instruments Nano Analysis Announcing Transfer of EMAX Series Sales and Maintenance Service Operations Greetings, and we trust that this communication finds your company enjoying strong and prosperous business conditions. Upon this occasion, we wish to convey our most profound gratitude for your... Read more
Hitachi High-Technologies Launches the SU7000: A Transformative Schottky Field Emission Scanning Electron Microscope
(PDF format, 268kBytes) — High Throughput, Large Chamber, Enhanced Versatility — Tokyo, Japan, July 31, 2018—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will launch the SU7000, a Schottky field emission scanning electron microscope (FE-SEM) that incorporates a large specimen chamber, enhanced versatility, and high throughput with simultaneous acquisition as well as... Read more