Peabody, Mass., April 17, 2006 — JEOL USA recently demonstrated a revolutionary remote capability for operating a transmission electron microscope (TEM) using a laptop computer with a cellular network connection. While seated at a picnic table 300 miles away, JEOL applications specialists manned the controls of a JEM-2200FS TEM operated at Lehigh University in Pennsylvania.... Read more
Peabody, Mass., April 7, 2006 – JEOL USA, a leading supplier of electron microscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President. Mr. Genovese has held successive management positions in the sales organization since joining JEOL in 1983. He manages... Read more
Peabody, Mass., March 17, 2006 — A new applications notebook from JEOL USA comprises more than 25 recent applications notes resulting from analyses using the AccuTOF™ DART™ (Direct Analysis in Real Time) mass spectrometer. The broad range of applications in this second volume of notes published since the introduction of DART includes pharmaceuticals, foods, industrial... Read more
Peabody, Mass., March 9, 2006 — A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation.... Read more
Peabody, Mass., February 14, 2006 – Live demos of a new low vacuum, high resolution SEM, direct analysis in real time mass spectrometer (AccuTOF-DART™), and remote operation of ECA/ECX NMR spectroscopy systems will be ongoing in the JEOL booth, #2132 and 2133 at the Orange County Convention Center West Building, Orlando, Florida. SEM Technology Throughout... Read more
Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images... Read more
Peabody, Mass., February 9, 2006 – Since capturing the Editor’s Gold Award for best new product at Pittcon 2005, the DART™ direct analysis ion source has found some unusual applications that, prior to this new technology, would have been virtually impossible. For example, fingerprints contain a great deal of chemical information that is not often... Read more
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Peabody, Mass., December 7, 2005 – The USA subsidiary of JEOL Ltd., an international supplier of electron microscopes and analytical instruments, has entered into a partnership agreement with Massachusetts Institute of Technology’s Institute for Soldier Nanotechnologies (ISN). The mission of the ISN, a research collaboration between the United States Army and MIT, is to develop... Read more
Peabody, Mass., September 30, 2005 – JEOL USA today announced that the United States Patent Office has awarded patent number 6,949,741, dated September 27, 2005, to JEOL USA, Inc. for the DART™ Direct Analysis in Real Time atmospheric pressure ion source. The DART, commercially introduced in February 2005 for the JEOL AccuTOF™ mass spectrometer, was... Read more