October 2, 2007 (Peabody, Mass.) — Get the latest in mass spectrometry applications and news from JEOL USA through its new online newsletter, Mass Media. Launched to meet the needs of the growing JEOL community of mass spec users, the newsletter includes links to newly-published papers by renowned scientists using JEOL mass spectrometers, new applications... Read more
August 23, 2007 (Peabody, Mass.) — JEOL USA received a distinguished visitor at its Peabody, Massachusetts office on Tuesday, August 21st, when the 2007 Ernst Ruska Prize winner, Professor Hiroshi Jinnai of Kyoto Institute of Technology, visited JEOL’s U.S. headquarters. Dr. Jinnai, an invited speaker at the American Chemical Society Fall conference held in Boston... Read more
Wesleyan’s Advanced Instrumentation Center has scoped out better way to conduct infinitesimal scientific research. In the past six months, the center has acquired a new, state-of-the art scanning electron microscope (JEOL JSM-6390LV SEM) for 3-D imaging, and a transmission electron microscope (JEOL JEM-1011 TEM) for 2-D sample images. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/83/New-Microscopes-Aid-Wesleyan-Researchers Read more
August 7 , 2007 (Peabody, Mass.) — JEOL USA will introduce and demonstrate a new compact, high-performance, 400MHz NMR spectrometer at ACS Fall 2007, August 20-22, in booth #919-921. The company will unveil the recently announced ECS-400 Nuclear Magnetic Resonance Spectrometer, featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet. The new, fully-digital ECS-400... Read more
August 2, 2007 (Peabody, Mass.) — JEOL USA, a leading supplier of electron microscopes and scientific instruments for nanotechnology, announced today that it has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. The microprobe was installed at NIST in Gaithersburg, Maryland, in one of the world’s most... Read more
June 25, 2007 (Peabody, Mass.) — JEOL USA has recently published the third edition of its popular AccuTOF-DART Direct Analysis in Real Time mass spectrometry applications notebook. The updated booklet contains new data on chemical reaction monitoring and detection of the peroxide explosives TATP and HMTD. A compilation of 28 applications notes describes analyses performed... Read more
New ink sampling technique takes a bite out of time https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/82/Ames-Laboratory-uses-DART-Mass-Spectrometry-to-Analyze-Inks-and-build-Sample-Library Read more
July 10, 2007 (Peabody, Mass.) — JEOL USA has introduced a new high resolution direct write e-beam lithography system to complement its family of spot beam, vector scan systems and mask production tools. The new JBX-5500FS direct write lithography tool writes patterns at a minimum line width of 10nm at 50kV on up to 100mm... Read more
JEOL USA (Peabody, Mass.) today announced a direct-write e-beam lithography system targeted at research labs and universities. The JBX-5500FS system is capable of 10 nm resolution at 50 kV on silicon pieces or wafers up to 100 mm. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/81/JEOL-Aims-Direct-Write-E-Beam-System-at-Academics Read more
A team of researchers from the Department of Energy’s Lawrence Berkeley National Laboratory, Purdue University and Hysitron Inc. in Minneapolis are using special instrumentation with the JEOL 3010 in situ transmission electron microscope to correlate high-resolution load-displacement measurements with individual video frames, showing how nanoscale volumes of aluminum deform under stress from a diamond “nanoindenter”.... Read more