August 5, 2013 (M&M 2013, Indianapolis, Indiana) — JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8.
Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy Society of America. JEOL and Protochips have combined efforts to showcase the new TEM technology with the Aduro thermal sample holder in the Protochips booth # 504 at M&M 2013, adjacent to the JEOL booth #303.
The new JEM-1400Plus TEM features high resolution/high contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography, and montaging.
JEOL, a leading supplier of electron microscopes, has sold more than 2400 of its 100-120kV range TEMs worldwide. This versatile TEM is optimized for biological, polymer, and materials research. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images.
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JEOL USA, Inc.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.
For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com, or call 978-535-5900.
https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/129/JEOL-Demonstrates-New-JEM-1400Plus-120kV-Transmission-Electron-Microscope-for-High-Contrast-CryoTEM-and-STEM-Applications