During the first part of this webinar, Dr. Wolfgang Grünewald, application specialist at Leica Microsystems, will demonstrate how the unique combination of pre-preparation system and ion milling system makes fast site specific sample preparation for Scanning Electron Microscopy or optical microscopy possible.
You will discover how keeping the sample in the same holder and observing the sample during the full preparation process will dramatically improve your sample preparation lead time.
In the second part of the webinar, Imène Esteve, expert in sample preparation for SEM at IMPMC, Paris, will explain why sample preparation choice is crucial for sample analysis and will describe further ion beam milling application illustrations.
Who would find this webinar informative:
- SEM users
- Engineers and researchers from companies and academics working with material samples such as polymers, multi-layers samples, electronics, stones, etc.
- Material scientists already working with ion beam milling