Introduction In a recently published comparison1 of the ambient ionization techniques direct analysis in real time (DART™ 2) and DESI3, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental... Read more
The recent acquisition of Jeol’s latest 300 kV field emission Transmission Electron Microscope (TEM), the JEM-3200FS, by Indiana University in the US for studying viruses is symptomatic of the ever increasing need for structural information about viruses to aid in the drug discovery process. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/84/JEOL-Puts-Viruses-Under-the-Microscope- Read more
August 2, 2007 (Peabody, Mass.) — JEOL USA, a leading supplier of electron microscopes and scientific instruments for nanotechnology, announced today that it has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. The microprobe was installed at NIST in Gaithersburg, Maryland, in one of the world’s most... Read more
July 10, 2007 (Peabody, Mass.) — JEOL USA has introduced a new high resolution direct write e-beam lithography system to complement its family of spot beam, vector scan systems and mask production tools. The new JBX-5500FS direct write lithography tool writes patterns at a minimum line width of 10nm at 50kV on up to 100mm... Read more
The University of York has taken a significant step into new fields of sub-Angstrom level materials research with the opening of the York JEOL Nanocentre. The interdisciplinary research and teaching centre represents a £5.5 million investment in novel nanoscience capability by the University of York, regional development agency, Yorkshire Forward, the European Union, and by... Read more
(Peabody, Mass.) JEOL USA is pleased to announce that the University of the Pacific has released information on the discovery of a breakthrough testing method for identifying foreign substances in pet food. Using the JEOL DART™ Direct Analysis in Real Time mass analysis technique on the AccuTOF-DART™ mass spectrometer, a chemistry professor and graduate student... Read more
January 16, 2007, Peabody, MA — For the first time in its 50+ year history, JEOL USA will be exhibiting at the IPC Printed Circuits Expo/APEX (February 18-22, 2007, Los Angeles, CA). JEOL USA will showcase an argon ion beam cross section polisher (CP) for specimen preparation prior to high magnification imaging with the scanning... Read more
Peabody, Mass., April 7, 2006 – JEOL USA, a leading supplier of electron microscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President. Mr. Genovese has held successive management positions in the sales organization since joining JEOL in 1983. He manages... Read more