Focus on the latest microscopy techniques and a wide range of applications News ZEISS will host the Day of Microscopy at the ZEISS Forum and ZEISS Microscopy Customer Centre Europe in Oberkochen on May 16 and 17, 2018. International guests from research, science and industry can expect a varied program of lectures, workshops and discussions... Read more
Built on renowned ZEISS Xradia platform and field-convertible to ZEISS Xradia Versa X-ray microscope JENA/Germany, 2018-04-11. ZEISS today introduces a new X-ray imaging instrument, ZEISS Xradia Context microCT, a large field-of-view, non-destructive 3D X-ray microcomputed tomography system. ZEISS Xradia Context is built on time-tested ZEISS Xradia technology, reaping crossover benefits of years of platform advancements... Read more
Iterative reconstruction with ZEISS OptiRecon News The new module for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes (XRM) will allow users to acquire high quality images in one-quarter the time: ZEISS OptiRecon uses a new, advanced iterative reconstruction technique. Now you can make the optimal choice for your requirements: same quality images four... Read more
JENA/Germany, 2017-12-12. Today ZEISS announces ZEISS ZEN Intellesis, a new machine learning capability that enables researchers to perform advanced analysis of their imaging samples across multiple microscopy methods. The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes integrated, easy to use, powerful segmentation for 2D and 3D datasets available to the routine... Read more
New members of the Executive Board of the ZEISS Group Effective 1 January 2018, Dr. Karl Lamprecht for the Semiconductor Manufacturing Technology segment and Dr. Jochen Peter for the Research & Quality Technology segment have been appointed to the Executive Board of the ZEISS Group Thomas Spitzenpfeil, Member of the Executive Board, to pursue new... Read more
Addressing the highest demands in imaging and analytics from any sample JENA/Germany, 2017-12-04. ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. With ZEISS GeminiSEM 450, users benefit from high resolution, surface sensitive... Read more
Improved optical sectioning delivers higher resolution without the need to acquire a z-stack JENA/Germany, 2017-11-15. At Neuroscience 2017, a new imaging mode for the ZEISS LSM 8 family with Airyscan has been introduced. Their unique 32-channel GaAsP array detector captures more spatial information than traditional confocal microscopes. The new 2D Superresolution mode now uses this... Read more
OBERKOCHEN/Germany, MOSCOW/Russia, 2017-11-03. ZEISS will strengthen its activities in Russia, the Ukraine, the Commonwealth of Independent States (CIS) and Georgia by acquiring a majority stake in the Optec Group, – the long-standing sales and service partner responsible for this territory. With this step, ZEISS is continuing and expanding its almost 115-year presence in the region.... Read more
Modular platform for intuitive operation, routine investigations and research applications JENA/Germany, 2017-11-02. ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of... Read more
JENA/Germany, 2017-10-26. A jury of experts from the German Design Council has voted the ZEISS Crossbeam 550 focused ion beam scanning electron microscope (FIB-SEM) as a winner of the German Design Award 2018 in the “Material and Surfaces” category. High-end applications in research and industry Users of this FIB-SEM investigate nanostructures such as composites, metals,... Read more