JEOL Leverages 50 Years of E-Beam Expertise to Bring New Metal Additive Manufacturing System to the Americas

(May 2, 2022, Peabody, Mass.) JEOL USA enters a new era of innovation with the introduction of metal additive manufacturing technology into North America backed by an extensive service and support network. JEOL, Ltd. (Tokyo, Japan) has entered the equipment production phase for the JEOL JAM-5200EBM, a new Electron Beam Melting (EBM) powder bed fusion... Read more

JEOL Introduces the Next Generation of JEOL NMR Spectrometers: The ECZ Luminous Series

Peabody, MA – JEOL USA is proud to announce the next generation of JEOL NMR spectrometers: the ECZ Luminous series. This product is a next step in spectrometer miniaturization and improving performance through state-of-the-art digital and high-frequency technologies. JEOL USA is a subsidiary of JEOL ltd, a well-respected manufacturer of  cutting-edge scientific equipment with more... Read more

JEOL Introduces New Scanning Electron Microscope with “Simple SEM” Automation and Live Elemental and 3D Analysis

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This... Read more

Covalent Metrology and JEOL Announce Partnership, Silicon Valley Demonstration Facility

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services. December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces... Read more

JEOL and SCiLS Sign a Distribution Agreement for SCiLS Lab MVS Software

JEOL Ltd. and SCiLS, a division of Bruker Daltonics, announced that they have concluded a non-exclusive, worldwide distribution agreement for SCiLS Lab MVS software. The SCiLS Lab has been the software of choice for researchers wanting to gain new insights from mass spectrometry imaging. Used in science and industry, the software sets new standards in... Read more

JEOL USA Welcomes New Managing Director, Hidetaka Sawada

April 19, 2021 Peabody, Mass. — JEOL USA welcomes a new Managing Director, Dr. Hidetaka Sawada, to its Peabody, Massachusetts office this April. Dr. Sawada is a world-renowned expert in aberration corrected electron microscopy. Most recently he served as General Manager of the Technical and Development group in the Electron Microscopy Business Unit of JEOL,... Read more

JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-T2000GC AccuTOF GC-Alpha

February 23, 2021, Peabody, Mass. – JEOL builds upon its legacy of successful AccuTOFTM GC series gas chomatograph – time-of-flight mass spectrometers with the release of the JMS-T2000GC “AccuTOF™ GC-Alpha”. This product is a GC-MS that represents significant improvement in performance and functionality using two newly developed key technologies. The basic hardware performance has been greatly improved and... Read more

JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-T2000GC AccuTOF™ GC-Alpha

February 17, 2021, Peabody, Mass. – JEOL builds upon its legacy of successful AccuTOF™ GC series gas chromatograph – time-of-flight mass spectrometers with the release of the JMS-T2000GC “AccuTOF™ GC-Alpha”. This product is a GC-MS that represents significant improvement in performance and functionality using two newly developed key technologies. The basic hardware performance has been greatly improved... Read more

Pristine Sample Preparation For SEM Using Broad Ion Beam Milling

Feb. 22, 2021 Peabody, Mass. – JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM).  The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down... Read more