Energy dispersive X-ray fluorescence (ED-XRF) spectrometers can analyze the composition and concentration of elements contained in samples by detecting fluorescence X-rays generated from the surface of samples irradiated with X-rays. They can be used to easily and non-destructively analyze samples in a wide range of forms, including solids and powders. The EDX-7000 and EDX-8000 energy dispersive X-ray fluorescence spectrometers, which Shimadzu released in September 2013, are widely used in a variety of industries, and a total of more than 1000 units have been sold worldwide.
With ED-XRF spectrometers, the detection of light elements, which are sensitive to the impact of the measurement atmosphere, requires measurements with the sample chamber under vacuum conditions. In contrast, for gas-generating samples and liquid samples, it is more effective to purge the air inside the sample chamber with helium gas. The release of the EDX-8100, which is compatible with helium purging, enables the high-sensitivity analysis of light elements in liquid samples.
The ability to start analysis quickly, without complicated pretreatment, is a key feature of ED-XRF spectrometers. With this feature and the increase in the forms of samples that can be measured with high sensitivity, Shimadzu is deploying energy dispersive X-ray fluorescence spectrometers in an even wider range of fields.