FOR IMMEDIATE RELEASE
Patricia Corkum, Marketing Manager
978-536-2273 • email@example.com • www.jeolusa.com
March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. The new EI/PI source complements the dedicated electron ionization (EI), positive/negative chemical ionization (CI), field desorption/field ionization (FD/FI) and combination EI/FI/FD ion sources and direct probes that make the GCX the most versatile GC/TOF and GCxGC/TOF system available. Much like field ionization, photoionization is a soft ionization method that provides molecular weight information with minimal fragmentation. The new PI lamp is installed on the EI ion source, making two ionization methods available to the operator without changing the hardware. Photoionization is very sensitive for certain environmentally important compound classes such as polycyclic aromatic hydrocarbons (PAHs). The new PI source is compatible with both standard gas chromatography (GC) and comprehensive two-dimensional gas chromatography (GCxGC).
A new method for hydrocarbon group type analysis
JEOL USA, Inc. has collaborated with customers, GC Image LLC and Zoex Corporation to develop a new approach to hydrocarbon group type analysis. Hydrocarbon group type analysis is a method for producing a comprehensive report that details the qualitative and quantitative composition of complex petrochemical mixtures such as crude oil, gasoline and diesel fuel. The new approach combines comprehensive two-dimensional gas chromatography (GCxGC) with field ionization (FI) and high-resolution mass spectrometry. GCxGC provides chromatographic separation of compound classes with nearly identical exact masses, but different retention behavior. Field ionization eliminates fragment ions that might be difficult to distinguish from molecular ions in complex mixtures. Enhancements to the GC Image software now make it possible to easily create reporting templates for compound classes such as alkanes, aromatics, and heteroaromatics.
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JEOL USA, Inc.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.
For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com, or call 978-535-5900.