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JEOL RESONANCE and Mestrelab Research S.L., announce technology partnership for qNMR market – qNMR seamless
posted on April 27, 2017
fully automated signal acquisition and qNMR analysis capability
New Field Emission Cryo-Electron Microscope JEM-Z200FSC
posted on April 27, 2017
automatically acquires image data for Single Particle Analysis over a long period of time
JEOL Exhibits InTouchScope SEM and Cross Section Polishing Abilities at Ceramics Expo
posted on April 25, 2017
(April 25, 2017, Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouc…
New FilterSpray™ Ionization Module Expands Analytical Capabilities of AccuTOFTM-DART®, the “Ambient Ionization Toolbox” Mass Spectrometer
posted on March 01, 2017
Makes it possible to spot a sample on a disposable paper triangle for analysis by ambient ionization
New JEOL NMR Probe for Fluorinated Compounds
posted on March 01, 2017
New level of flexibility for NMR analysis of fluorinated compounds prevalent in many new pharmaceutical products
JEOL Highlights New Analytical Technologies at ASMS 2016
posted on June 02, 2016
JEOL Founders Recognized with Pittcon Heritage Award
posted on March 25, 2016
March 24, 2016 Peabody, MA — JEOL is honored to announce that the company founders were recognized for their scientific vision and pioneering leaders…
JEOL Demonstrates New Analytical Technology at Pittcon 2016
posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta GA) — JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Geo…
JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis
posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) — At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectromet…
New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer
posted on March 07, 2016
March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’…
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http://www.jeolusa.com/NEWS-EVENTS/Press-Releases/ID/380/New-Field-Emission-Cryo-Electron-Microscope-JEM-Z200FSC