JEOL Introduces New Best-in-Class Field Emission SEM

Share This.....Share on LinkedInTweet about this on TwitterShare on FacebookShare on Google+Email this to someone

FOR IMMEDIATE RELEASE

CONTACT:
Patricia Corkum, Marketing Manager
978-536-2273 • pcorkum@jeol.com • www.jeolusa.com

September 1, 2015, Peabody, MA — JEOL USA has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope, demonstrated for the first time at M&M 2015 in Portland, Oregon.

The new JSM-7200F is a best-in-class FE SEM with ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. This versatile, user-friendly FE SEM is a compact system designed for easy installation and operation.

Featuring through-the-lens detectors that can collect a variety of signals by varying the built-in energy filter, the JSM-7200F produces a large amount of data in a very short amount of time. For the fast-paced manufacturing environment the JSM-7200F is a high throughput easy-to-use FE SEM. For the research environment, it offers the analyst a wide variety of contrast mechanisms. Seamless observation and analysis using EDS, WDS, EBSD, STEM, BSE, and CL can be conducted easily and efficiently.

The JSM-7200F is an all-in-one SEM designed for any type of sample or analysis, including magnetic samples, non-conducting materials, biological specimens, and semiconductor devices. It is the latest addition to JEOL’s Field Emission SEM family, which includes the JSM-7800F PRIME with unmatched extreme high resolution and low and high kV (7Å at both 1.0kV and 15kV) operation.

When integrated with Gatan 3View® Serial Block Face Imaging System, the JSM-7200F is ideal for neuroscience applications or any other 3D tomography imaging application.

A new Soft X-ray Emission Spectrometer designed for JEOL FE SEMs and microprobes allows efficient and parallel collection of very low energy-rays (WDS) with chemical state analysis.

The JSM-7200F offers the best resolution in its class for an entry level Field Emission SEM with a wide variety of analytical functions, fast acquisition with minimum beam dwell time, and a user-friendly interface for a multi-user environment with remote operation and diagnostics.

# # #

JEOL USA, Inc.

JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.

For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com, or call 978-535-5900.

http://www.jeolusa.com/NEWS-EVENTS/Press-Releases/ID/347/JEOL-Introduces-New-Best-in-Class-Field-Emission-SEM