GE Analytical Instruments Expands Direct Operations into Italy

October 1, 2012 – Boulder, CO – GE Analytical Instruments announces the expansion of its direct European operations into Italy, effective June, 2012. This expansion is designed to better serve Sievers ultrapure water (UPW) and InnovOx total organic carbon (TOC) Analyzer customers by providing direct sales and applications support through local factory-trained staff. All GE Analytical... Read more

JEOL High Sensitivity GC-TOF Increases Data Acquisition Speed and Mass Resolving Power

August 3, 2012 (Peabody, Mass.) – JEOL’s newest AccuTOF GCv model – the “4G” – now offers even faster data acquisition rates and higher resolving power than its predecessor. The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a resolving power of 8000. The 50 Hz acquisition rate now makes... Read more

JEOL USA Partners with Chilean Agent Arquimed

September 27, 2011 (Peabody, MA) — JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody, Massachusetts, has entered an agreement with Arquimed, Ltda. making Arquimed JEOL’s exclusive agent in Chile. Arquimed, located in Santiago, has a 75-year history as one... Read more

New Koch Institute for Integrative Cancer Research at MIT Selects JEOL Transmission Electron Microscope

October 25, 2010 (Peabody, Mass.) — JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for... Read more

National Government Standards Lab Selects JEOL Atomic Resolution Microscope for R&D

September 20, 2010 (Peabody, MA) — JEOL announces a major order for the company’s atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured... Read more

UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope

March 18, 2010, Peabody, Mass. — JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the... Read more

JEOL Introduces Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition

July 28, 2008 (Peabody, MA) — JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring... Read more

JASCO And Princeton Chromatography, Inc. Announce Collaboration

JASCO and Princeton Chromatography are pleased to announce a new collaboration in the areas of Supercritical Fluid Chromatography (SFC) instrumentation and Supercritical Fluid Chromatography column manufacturing. JASCO, with U.S. offices in Easton, MD, manufactures both analytical and preparative supercritical fluid chromatography systems. SFC offers an excellent alternative to normal phase HPLC with the advantages of... Read more

USC Selects JEOL for New Center of Excellence

November 5, 2007 (Peabody, Mass.) — JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university’s Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL... Read more

Indiana University Selects JEOL 300kV TEM for Virus and Nanotechnology Studies

April 10, 2007, Peabody, Mass. — The acquisition of a new 300 kV field emission Transmission Electron Microscope (TEM) from JEOL distinguishes Indiana University, Bloomington, Indiana as a major United States research facility where scientists can examine both biological and materials science structures at nanoscale resolution. Acquisition of the new JEOL TEM was completed in... Read more